Analysis with X-Ray Diffraction (XRD)
RJ Lee Group uses X-ray diffraction (XRD), a powerful, nondestructive technique for characterizing crystalline materials. RJ Lee Group uses the very latest XRD Panalytical Empyrean with BBHD optics and 1Der detector. This state-of-the-art technology gives better resolution and sensitivity, providing very low detection limits for short duration exposures. It also increases throughput and eliminates redundancy, allowing us to offer rapid turnaround times with high quality output.
We employ a clean plasma ashing
method for air sample preparations, eliminating the filter without leaving ash or other residues that can contaminate samples.
Quick turnaround available
Low detection limits
Identification of interferences
Scientific consultation
Increased resolution
Identifying interferences
RJ Lee Group's state-of-the-art technology allows us to detect silica at very low levels and from short exposures. Our experts leverage this increased sensitivity, coupled with years of experience, to identify iterferences in collected samples. Other minerals, such as mica, clays, kaolin, feldspar, and graphite can greatly reduce the accuracy of test results if they are not properly classified. Identifying these interferences can also alert you to other issues you may not have been aware of.